首页> 外文会议>Symposium on Nanophase and Nanocomposite Materials III held November 29-December 2, 1999, Boston, Massachusetts, U.S.A. >Z-contrast stem imaging and eels of cdse nanocrystals: towards the analysis of individual nanocrystal surfaces
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Z-contrast stem imaging and eels of cdse nanocrystals: towards the analysis of individual nanocrystal surfaces

机译:Z对比茎成像和cdse纳米晶体的鳗鱼:用于分析单个纳米晶体表面

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We have applied Atomic Number Contrast Scanning Transmission Electron Microscopy (Z-Contrast STEM) and STEM/EELS (Electron Energy Loss Spectroscopy) towards the study of colloidal CdSe semiconductor nanocrystals embedded in MEH-PPV polymer films. Z-Contrast images are direct projections of the atomic structure. Hence they can be interpreted without the need for sophisticated image simulation and the image intensity is a direct measure of the thickness of a nanocrystal. Our thickness measurements are in agreement with the predicted faceted shape of these nanocrystals.
机译:我们已经应用原子序数对比扫描透射电子显微镜(Z-Contrast STEM)和STEM / EELS(电子能量损失谱)来研究嵌入MEH-PPV聚合物薄膜中的胶体CdSe半导体纳米晶体。 Z对比图像是原子结构的直接投影。因此,无需复杂的图像模拟就可以解释它们,并且图像强度是纳米晶体厚度的直接量度。我们的厚度测量与这些纳米晶体的预测多面形状一致。

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