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首页> 外文会议>Symposium on Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures Dec 2-6, 2002 Boston, Massachusetts, U.S.A. >First Applications of Electron Energy-Loss Spectroscopy with High Energy Resolution
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First Applications of Electron Energy-Loss Spectroscopy with High Energy Resolution

机译：具有高能量分辨率的电子能量损失谱的首次应用

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摘要

A new transmission electron microscope equipped with a monochromator and a high resolution energy-filter was used for the first time to fully exploit the chemical bonding information contained in the near edge fine structures (ELNES) of electron energy-loss spectra. The instrument is capable of acquiring spectra with an energy resolution in the range of 0.1 eV, thus opening up the way for improved ELNES information. ELNES spectra of TiO_2 and CoO have been recorded and are compared with data obtained with a conventional microscope and with x-ray absorption spectroscopy. In case of the L_(2,3) edges of the transition metals the new instrument revealed previously unobservable fine structure details, but for the O K edges the improved energy resolution does not result in more detailed structural features than observable in common microscopes. Furthermore, the potential of the new microscope to obtain chemical bonding information at the nanometer scale is discussed.
机译：首次使用配备有单色仪和高分辨率能量过滤器的新型透射电子显微镜来充分利用电子能量损失谱的近边缘精细结构（ELNES）中包含的化学键信息。该仪器能够以0.1 eV的能量分辨率采集光谱，从而为改善ELNES信息开辟了道路。记录了TiO_2和CoO的ELNES光谱，并将其与常规显微镜和X射线吸收光谱法获得的数据进行比较。在过渡金属的L_（2,3）边缘的情况下，新仪器揭示了以前无法观察到的精细结构细节，但对于O K边缘，提高的能量分辨率并没有比普通显微镜所观察到的结构特征更详细。此外，讨论了新型显微镜在纳米尺度上获得化学键信息的潜力。

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