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首页> 外文期刊>Metallurgical and Materials Transactions A >Investigation of the structure and composition of a {111} incoherent Zr/ZrN interface containing ledges by high-resolution transmission electron microscopy, image simulation, electron energy-loss spectroscopy, energy-filtering transmission electron microscopy, and near-coincidence-site analysis
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Investigation of the structure and composition of a {111} incoherent Zr/ZrN interface containing ledges by high-resolution transmission electron microscopy, image simulation, electron energy-loss spectroscopy, energy-filtering transmission electron microscopy, and near-coincidence-site analysis

机译：高分辨率透射电子显微镜，图像模拟，电子能量损失谱，能量过滤透射电子显微镜和近符合现场分析法研究包含壁架的{111}非相干Zr / ZrN界面的结构和组成

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摘要

Investigation of the atomic structure of a (111) Zr/ZrN interface shows that it is a type-3 incoherent interface (i.e., high-index orientation relationship with a low-index interface plane in only one phase), as determined from conventional transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) images, image simulations, and near-coincidence-site atomic modeling of the interface. Long facets and atomic ledges several {111}ZrN planes high form at the interface, indicating that such features cannot be used as criteria to define partial coherency at interfaces. These results also indicate that ledgewise growth is possible during the phase transformation from Zr to ZrN. Composition profiles taken across the interface using energy-filtering TEM and the N K-edge show that the composition changes abruptly at the interface, in accord with the structural transformation. Simulation results on an inclined (111) Zr/ZrN interface indicate that it is possible to judge whether an interface is inclined and faceted at the same time. A rough interface can look faceted in a HRTEM image due to projection effects, but only under a very strict set of conditions. Conversely, an interface cannot be faceted if it looks rough in an HRTEM image.
机译：对（111）Zr / ZrN界面的原子结构的研究表明，它是3型非相干界面（即，与低折射率界面平面仅在一个相中具有高折射率取向关系），这是根据常规透射确定的电子显微镜（TEM）和高分辨率TEM（HRTEM）图像，图像模拟以及界面的重合点原子建模。长的小面和原子壁架在界面处形成了多个{111} ZrN 平面，表明这些特征不能用作定义界面处部分相干性的标准。这些结果还表明，在从Zr到ZrN的相变过程中，有可能沿横向生长。使用能量过滤TEM和N K边缘在界面上获取的成分分布图表明，根据结构转变，成分在界面上突然改变。在倾斜的（111）Zr / ZrN界面上的仿真结果表明，可以判断界面是否同时倾斜和刻面。由于投影效果，仅在非常严格的条件下，粗糙的界面才能在HRTEM图像中看起来像刻面。相反，如果界面在HRTEM图像中看起来粗糙，则无法刻面。

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  • 来源
    《Metallurgical and Materials Transactions A》 |2006年第3期|879-893|共15页
  • 作者

    P. Li; J. M. Howe; W. T. Reynolds Jr.;

  • 作者单位

    the Center for Solid State Science Arizona State University 85287-1704 Tempe AZ;

    the Department of Materials Science and Engineering University of Virginia 22904-4745 Charlottesville VA;

    the Department of Materials Science and Engineering Virginia Polytechnic Institute 24060 Blacksburg VA;

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