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首页> 外文会议>Symposium on Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures Dec 2-6, 2002 Boston, Massachusetts, U.S.A. >Micro Raman Spectroscopy of Silicon Nanocrystals Produced by Picosecond Pulsed Laser Ablation
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Micro Raman Spectroscopy of Silicon Nanocrystals Produced by Picosecond Pulsed Laser Ablation

机译：皮秒脉冲激光烧蚀产生的硅纳米晶体的显微拉曼光谱

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摘要

Pulsed laser ablation has been used to produce silicon nanocrystals. Variation of the laser fluence, backing gas type and pressure result in nanocrystals with controllable size distributions. Properties of nanocrystals produced with this method also depend on the distance of the nanocrystal from the center of the laser plume. Correlated atomic force microscopy and in-situ micro-Raman measurements confirm that particle size decreases as distance from the plume center increases. Silicon peaks in the micro raman spectra taken at increasing distance from plume center show considerable differences in both center energy and width. Confocal micro raman spectra from thicker ( > 10 micron) samples show little variation with depth, in contrast with porous silicon samples.
机译：脉冲激光烧蚀已用于生产硅纳米晶体。激光能量密度，支撑气体类型和压力的变化导致纳米晶体的尺寸分布可控。用这种方法生产的纳米晶体的性能还取决于纳米晶体与激光羽流中心的距离。相关的原子力显微镜和原位显微拉曼测量证实，随着距羽中心的距离增加，粒径减小。距烟羽中心越来越远的显微拉曼光谱中的硅峰在中心能量和宽度上都显示出相当大的差异。与多孔硅样品相比，较厚（> 10微米）样品的共聚焦显微拉曼光谱显示随深度的变化很小。

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