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Characteristics of a linear array of a-Si:H thin film position sensitive detector

机译：a-Si：H薄膜位置敏感探测器的线性阵列的特性

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The increasing demand in automation processes in finishing techniques also calls for automatic measurement and inspection methods. These methods ought to be installed as close as possible to the production process and they ought to measure the values needed in a safe and fast way, without disturbing the process itself. Simultaneously they should be free of wear and insensitive against mechanical perturbations. This approach can be reached by proper combination of the laser triangulation technique with an array of linear position sensitive detectors, able to supply information about the surface finishing of an object. This is the aim of this paper that envisages to present experimental results of the performances exhibited by such an array constituting 128 elements. The analogue information supplied by this array is processed by an analogue/digital converter, directly coupled to the array and whose information is computer processed, concerning the recognition of patterns and the processing of information collected. direct c 1999 Elsevier Science S.A. All rights reserved.
机译：精加工技术对自动化过程的需求不断增长，也要求采用自动测量和检查方法。这些方法应该安装在尽可能接近生产过程的位置，并且应该以安全，快速的方式测量所需的值，而不会干扰过程本身。同时，它们应无磨损且对机械干扰不敏感。可以通过将激光三角测量技术与线性位置敏感检测器阵列适当组合来实现此方法，该检测器能够提供有关物体表面光洁度的信息。这是本文的目的，设想呈现由构成128个元素的这种阵列表现出的性能的实验结果。由该阵列提供的模拟信息由直接耦合到该阵列的模拟/数字转换器处理，其信息由计算机处理，涉及模式识别和所收集信息的处理。直接c 1999 Elsevier Science S.A.保留所有权利。

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