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Deposition of microcrystalline silicon in an integrated distributed electron cyclotron resonance PECVD reactor

机译:在集成分布式电子回旋共振PECVD反应器中沉积微晶硅

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The deposition of #mu#c-Si in a low pressure high density plasma reactor is studied. Films were deposited either from pure silane or from the mixture of SiH_4 and H_2 onto glass substrates and deposition kinetics followed with kinetic phase modulated ellipsometry Growth rates of up to 0.8 nm/s were achieved with good quality material. Crystalline fraction shows a strong dependence on process pressure and exceeds 80
机译:研究了#mu#c-Si在低压高密度等离子体反应器中的沉积。从纯硅烷或SiH_4和H_2的混合物将薄膜沉积到玻璃基板上,然后进行沉积动力学,然后进行动力学相位调制椭圆偏振法,使用优质材料可获得高达0.8 nm / s的生长速率。结晶分数对工艺压力有很强的依赖性,超过80

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