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The vertical heterojunction MOSFET

机译:垂直异质结MOSFET

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摘要

In this paper a new vertical MOS transistor structure including its fabrication and electrical results will be presented. It overcomes the technological and physical limitations encountered when scaling the classical planar transistor into the deep submicron regime. It solves the technological issue by defining the channel length through epitaxial growth instead of lithography. The physical phenomenon of drain induced barrier lowering (DIBL) is largely decreased through the use of a heterojunction between source and drain.
机译:本文将介绍一种新的垂直MOS晶体管结构,包括其制造和电学结果。它克服了将传统的平面晶体管缩放到深亚微米范围时遇到的技术和物理限制。它通过外延生长而不是光刻来定义沟道长度来解决技术问题。通过使用源极和漏极之间的异质结,可以大大降低漏极引起的势垒降低(DIBL)的物理现象。

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