首页> 外文会议>Thrid Workshop on Nanoscience amp; Nanotechnology: Nanostructured Materials Application and Innovation Transfer Nov 30-Dec 1, 2001 Sofia, Bulgaria >REAL TIME COMPUTING METHOD AND DEVICE FOR MEASUREMENT OF ELECTROCONDUCTIVITY WITHOUT ANALOG TO DIGITAL CONVERTER
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REAL TIME COMPUTING METHOD AND DEVICE FOR MEASUREMENT OF ELECTROCONDUCTIVITY WITHOUT ANALOG TO DIGITAL CONVERTER

机译:无需模拟数字转换器即可测量电导率的实时计算方法和装置

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摘要

The design and development of measurement devices during the last decade has become important connected with the modern microprocessor electronics. The proposed study diels with design of method and device for measuring electrical quantities, which is consistent with these tendencies. An apparatus measuring the real-time electrical resistance of an electro-conducting medium, without using an analog-digital converter is proposed, which is based on a single-chip microcomputer. The method used allows collecting conductivity data in a real time by use of a dc voltage. An original measurement algorithm is proposed, which converts the electrical resistance of a random medium into time of discharging a capacitor with a known capacity.
机译:在过去的十年中,测量设备的设计和开发与现代微处理器电子设备相关联变得非常重要。拟议的研究与测量电量的方法和设备的设计有关,这与这些趋势是一致的。提出了一种不使用模数转换器即可测量导电介质的实时电阻的装置,该装置基于单片机。所使用的方法允许通过使用直流电压实时收集电导率数据。提出了一种原始的测量算法,该算法将随机介质的电阻转换为对具有已知容量的电容器放电的时间。

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