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Properties of Semi-Insulating GaAs:Fe Grown by Hydride Vapour Phase Epitaxy

机译:氢化物气相外延生长的半绝缘GaAs:Fe的性质

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摘要

In this article we analyse GaAs grown by Hydride Vapour Phase Epitaxy (HVPE) and doped with four different iron concentrations between 4x10~(16) to 4.5 x 10~(20) cm~(-3). From temperature dependent I-V measurements we obtain that the resistivity of the lowest doped sample is the highest. We also quantified the activation energy. These results together with those of time - resolved photoluminescence measurements indicate that the sample with the lowest Fe concentration, EL2 may be dominant. From the analysis of the time-resolved photoluminescence measurements, the intrinsic EL2 concentration and the electron and hole capture cross sections of Fe in GaAs were estimated.
机译:在本文中,我们分析了由氢化物气相外延(HVPE)生长并掺杂了4x10〜(16)至4.5 x 10〜(20)cm〜(-3)之间四种不同铁浓度的GaAs。从与温度相关的IV测量中,我们可以得出最低掺杂样品的电阻率最高。我们还量化了活化能。这些结果与时间分辨的光致发光测量结果一起表明,具有最低Fe浓度的样品EL2可能是主要的。通过对时间分辨光致发光测量结果的分析,可以估算GaAs中本征EL2的浓度以及Fe的电子和空穴俘获截面。

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