CSI Helsinki: comparing three-dimensional imaging of diagonal cutter toolmarks using confocal microscopy and SWLI

著录项

• 来源
  《Three-dimensional imaging, visualization, and display 2010 and display technologies and applications for defense, security, and avionics IV》|2010年|P.76900Y.1-76900Y.9|共9页
• 会议地点 Orlando FL(US)
• 作者

  I. Kassamakov; rnC. Barbeau; rnS. Lehto; rnP. Ahvenainen; rnT. Reinikainen; rnE. Hasggstroem;

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• 作者单位

  Dept. of Physics, University of Helsinki, P.O.B. 64, FIN-00014 University of Helsinki, Finland;

  rnForensic Technology Inc., Montreal, Canada;

  National Bureau of Investigation, Forensic Laboratory, Vantaa, Finland;

  rnDept. of Physics, University of Helsinki, P.O.B. 64, FIN-00014 University of Helsinki, Finland;

  rnNational Bureau of Investigation, Forensic Laboratory, Vantaa, Finland;

  rnDept. of Physics, University of Helsinki, P.O.B. 64, FIN-00014 University of Helsinki, Finland;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 信息处理（信息加工）;
• 关键词

  forensic science; toolmarks; scanning white light interferometry; confocal microscopy;

  机译：法医学工具标记；扫描白光干涉法；共聚焦显微镜;