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In situ Preparation of Metal, Metaloxide and Metalnitride Films by Ion Beam Sputtering

机译:离子束溅射原位制备金属,金属氧化物和金属氮化物薄膜

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Studying thin film properties under UHV conditions, the films are more often prepared by evaporation techniques than by sputtering techniques. But films of some materials are not preparable by evaporation techniques. Therefore we have used the arrangement for secondary ion mass spectroscopy (SIMS) to prepare thin films by reactive and non-reactive ion beam sputtering with the aim to get thin films with deposition rates comparable to those for evaporation.
机译:研究超高压条件下的薄膜性能,通常采用蒸发技术而非溅射技术来制备薄膜。但是某些材料的薄膜不能通过蒸发技术制备。因此,我们已采用二次离子质谱(SIMS)的布置,通过反应性和非反应性离子束溅射制备薄膜,目的是获得沉积速率与蒸发速率相当的薄膜。

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