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Cross-Section TEM of Electrodeposited Palladium Films

机译:电沉积钯膜的截面TEM

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Pd electrodeposits have been examined using cross-section TEM. It is observed that the Pd consists of columnar grains whose grain boundary planes are parallel to the thickness of the deposit. The grains consist primarily of parallel twins and exhibit a [110] crystallographic texture. The grain width increases with deposit thickness and decreases with plating bath pH> FIB specimen preparation techniques are shown to be suitable for cross-section TEM examination.
机译:已经使用横截面TEM检查了Pd电沉积物。可以看出,Pd由柱状晶粒组成,其晶界平面平行于沉积物的厚度。晶粒主要由平行孪晶组成,并表现出[110]晶体结构。晶粒宽度随沉积物厚度的增加而增加,而随电镀液的pH> FIB试样制备技术而减小,表明该技术适用于横截面TEM检查。

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