A New Post-Silicon Debug Approach Based on Suspect Window

机译：基于可疑窗口的新型硅后调试方法

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摘要

Bugs are tending to be unavoidable in the design of complex integrated circuits. It is imperative to identify the bugs as soon as possible by post-silicon debug. The main challenge for post-silicon debug is the observability of the internal signals. This paper exploits the fact that it is not necessary to observe the error free states. Then we introduce "suspect window" and present a method for determining its boundary. Based on suspect window, we propose a debug approach to achieve high observability by reusing scan chain. Since scan dumps take place only in suspect window, debug time is greatly reduced. Experiment results demonstrate the effectiveness of the proposed approach.

机译：在复杂的集成电路设计中，错误是不可避免的。必须通过硅后调试来尽快发现错误。硅后调试的主要挑战是内部信号的可观察性。本文利用了一个事实，即不必观察无错误状态。然后我们介绍“可疑窗口”并提出一种确定其边界的方法。基于可疑窗口，我们提出了一种通过重用扫描链来实现高可观察性的调试方法。由于扫描转储仅发生在可疑窗口中，因此大大减少了调试时间。实验结果证明了该方法的有效性。

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来源
《VLSI Test Symposium, 2009. VTS '09》|2009年|85-90|共6页
会议地点 Santa Cruz CA(US);Santa Cruz CA(US)
作者
Jianliang Gao; Yinhe Han; Xiaowei Li;
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作者单位

Key Lab. of Comput. Syst. Archit., Chinese Acad. of Sci., Beijing, China;

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关键词
integrated circuit design; monolithic integrated circuits; complex integrated circuit design; error free states; post-silicon debug approach; scan chain; suspect window; bug; post-silicon debug; scan; trace;

机译：集成电路设计;单片集成电路;复杂集成电路设计;无错误状态;后硅调试方法;扫描链;可疑窗口;错误;后硅调试;扫描;跟踪;

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1. A Novel Post-Silicon Debug Mechanism Based on Suspect Window [J] . Jianliang GAO, Yinhe HAN, Xiaowei LI IEICE transactions on information and systems . 2010,第5期

机译：基于可疑窗口的新型硅后调试机制
2. A Novel Post-Silicon Debug Mechanism Based on Suspect Window [J] . Jianliang GAO, Yinhe HAN, Xiaowei LI IEICE Transactions on Information and Systems . 2010,第5期

机译：基于可疑窗口的新型硅后调试机制
3. A Hybrid Approach for Fast and Accurate Trace Signal Selection for Post-Silicon Debug [J] . Li M., Davoodi A. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on . 2014,第7期

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4. A New Post-Silicon Debug Approach Based on Suspect Window [C] . Jianliang Gao, Yinhe Han, Xiaowei Li IEEE VLSI Test Symposium . 2009

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5. Development of an Activity-Based Windowing Approach to Evaluate Real-World NOx Emissions from Modern Medium and Heavy-Duty Diesel Trucks [D] . Pondicherry, Rasik. 2020

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7. A new post-silicon debug approach based on suspect window [O] . Jianliang Gao, Yinhe Han, Xiaowei Li 2009

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8. ORGBUG -- A windows-based combinatorial geometry debugger. [R] . Burns, T. J. 1993

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A New Post-Silicon Debug Approach Based on Suspect Window

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