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首页> 外文学位 >Vector error correction of time domain waveforms in a vector network analyzer employing digital modulation.
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Vector error correction of time domain waveforms in a vector network analyzer employing digital modulation.

机译：在采用数字调制的矢量网络分析仪中时域波形的矢量误差校正。

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摘要

Emerging electronic devices have been developed to support higher data rates and bandwidths. Such devices require thorough characterization, during both design and fabrication. Unfortunately, many current test methods rely on narrowband measurements. In this research, a sophisticated digital signal processing technique is used in a vector network analyzer (VNA) to accommodate so-called modulated scattering parameters and time domain waveforms. The distinctive innovation is to determine time domain representations of the incident waveform, the reflected waveform, and the transmitted waveform at the device under test (DUT) terminals, which will later be used to determine the DUT frequency response. In order to find the time domain waveforms and DUT response, a de-embedding technique is performed to eliminate the effects of all fixtures located between the VNA and the DUT. This dissertation presents the theoretical analysis of the VNA measurement system, as well as the simulation of uncertainty of the error adapter, the impact of the additive white Gaussian measurement noise and quantization, and the effects of bandwidth limitations of the VNA system. Additionally incident and reflected DUT waveforms are de-embedded and the RMS error is calculated. The results show that error adapter parameter uncertainties less than 10% yield RMS errors less than 0.1 dB. The error floor due to noise is approached when the system is operated at SNRs above 30 dB. Quantizers employing at least 14 bits provide sufficient measurement accuracy.
机译：已经开发出新兴的电子设备来支持更高的数据速率和带宽。在设计和制造过程中，此类器件都需要全面表征。不幸的是，许多当前的测试方法都依赖于窄带测量。在这项研究中，矢量网络分析仪（VNA）中使用了一种复杂的数字信号处理技术来适应所谓的调制散射参数和时域波形。独特的创新在于确定被测设备（DUT）端子处的入射波形，反射波形和传输波形的时域表示形式，这些表示形式随后将用于确定DUT频率响应。为了找到时域波形和DUT响应，执行了去嵌入技术，以消除位于VNA和DUT之间的所有灯具的影响。本文介绍了VNA测量系统的理论分析，误差适配器不确定度的仿真，加性高斯白噪声和量化的影响以及VNA系统带宽限制的影响。此外，对入射和反射的DUT波形进行去嵌入，并计算RMS误差。结果表明，误差适配器参数不确定度小于10％，RMS误差小于0.1 dB。当系统以高于30 dB的SNR运行时，将接近由于噪声引起的错误基底。采用至少14位的量化器可提供足够的测量精度。

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  • 作者

    Mathurasai, Tanawat.;

  • 作者单位

    University of Colorado at Colorado Springs.;

  • 授予单位 University of Colorado at Colorado Springs.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2005
  • 页码 215 p.
  • 总页数 215
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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