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Electrostatic radio frequency (RF) microelectromechanical systems (MEMS) switches with metal alloy electric contacts.

机译:带有金属合金电触点的静电射频(RF)微机电系统(MEMS)开关。

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Radio frequency (RF) microelectromechanical systems (MEMS) switches are paramount in importance for improving current and enabling future USAF RF systems. Electrostatic micro-switches are ideal for RF applications because of their superior performance and low power consumption. The primary failure mechanisms for micro-switches with gold contacts are becoming stuck closed and increased contact resistance with increasing switch cycles. This dissertation reports on the design, fabrication, and testing of micro-switches with sputtered bimetallic (i.e., gold (Au)-on-Au-(6.3at%)platinum (Pt)), binary alloy (i.e., Au-(3.7at%)palladium (Pd) and Au-(6.3at%)Pt), and ternary alloy (i.e., Au-(5at%)Pt-(0.5at%)copper (Cu)) contact metals. Performance was evaluated, in-part, using measured contact resistance and lifetime results. The micro-switches with bi-metallic and binary alloy contacts exhibited contact resistance between 1--2 ohms and, when compared to micro-switches with sputtered gold contacts, showed an increase in lifetime. The micro-switches with tertiary alloy contacts showed contact resistance between 0.2--1.8---and also showed increased lifetime. Overall, the results presented in this dissertation indicate that micro-switches with gold alloy electric contacts exhibit increased lifetimes in exchange for a small increase in contact resistance.
机译:射频(RF)微机电系统(MEMS)开关对于改善电流和支持未来的USAF RF系统至关重要。静电微动开关具有卓越的性能和低功耗,因此是RF应用的理想选择。具有金触点的微动开关的主要故障机制正变得闭合,并且随着开关周期的增加,接触电阻也增加。本文报道了具有双金属溅射(即金(Au)-金(6.3at%)铂(Pt)),二元合金(即Au-(3.7)的微动开关的设计,制造和测试。钯(Pd)和金(6.3at%)Pt)和三元合金(金(5at%)Pt-(0.5at%)铜(Cu))接触金属。使用测得的接触电阻和使用寿命结果部分评估了性能。具有双金属和二元合金触点的微动开关的接触电阻在1--2欧姆之间,与具有溅射金触点的微动开关相比,其使用寿命增加。具有三级合金触点的微动开关的接触电阻在0.2--1.8-之间,并且使用寿命也更长。总体而言,本文提出的结果表明,具有金合金电触点的微动开关具有更长的寿命,而接触电阻的增加很小。

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