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Dielectric-loaded microwave cavity for high-gradient testing of superconducting materials.

机译：介电加载的微波腔，用于超导材料的高梯度测试。

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摘要

A superconducting microwave cavity has been designed to test advanced materials for use in the accelerating structures contained within linear colliders. The electromagnetic design of this cavity produces surface magnetic fields on the sample wafer exceeding the critical limit of Niobium. The ability of this cavity to push up to 4 times the critical field provides, for the first time, a short sample method to reproducibly test these thin films to their ultimate limit. In order for this Wafer Test cavity to function appropriately, the large sapphire at the heart of the cavity must have specific inherent qualities. A second cavity was constructed to test these parameters: dielectric constant, loss tangent, and heat capacity. Several tests were performed and consistent values were obtained. The consequences of these measurements were then applied to the Wafer Cavity, and its performance was evaluated for different power inputs. The Q0 of the cavity could be as low as 10 7 because of the sapphire heating, therefore removing the ability to measure nano-resistances. However, with additional measurements in a less complex environment, such as the Wafer Test Cavity, the Q 0 could be higher than 109.
机译：设计了一种超导微波腔，以测试用于直线对撞机内加速结构的先进材料。该腔的电磁设计在样品晶片上产生的表面磁场超过了铌的临界极限。该腔体将临界场推高至4倍的能力首次提供了一种短样本方法，可重复测试这些薄膜至其极限。为了使晶片测试腔正常工作，位于腔中心的大型蓝宝石必须具有特定的固有质量。构造第二个空腔来测试这些参数：介电常数，损耗角正切和热容量。进行了几次测试，并获得了一致的值。然后将这些测量的结果应用于晶片腔，并针对不同的功率输入评估其性能。由于蓝宝石的加热，腔体的Q0可能低至10 7，因此消除了测量纳米电阻的能力。但是，在不那么复杂的环境中进行其他测量（例如晶圆测试腔）时，Q 0可能会高于109。

著录项

  • 作者

    Pogue, Nathaniel Johnston.;

  • 作者单位

    Texas A&M University.;

  • 授予单位 Texas A&M University.;
  • 学科 Engineering Materials Science.;Physics Elementary Particles and High Energy.
  • 学位 Ph.D.
  • 年度 2011
  • 页码 201 p.
  • 总页数 201
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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