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Effect of Transmission Line Measurement (TLM) Geometry on Specific Contact Resistivity Determination.

机译：传输线测量（TLM）几何形状对比接触电阻率测定的影响。

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作者
Grover, Sidhant.;
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作者单位

Rochester Institute of Technology.;

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授予单位 Rochester Institute of Technology.;
学科 Materials science.;Electrical engineering.
学位 M.S.
年度 2016
页码 111 p.
总页数 111
原文格式 PDF
正文语种 eng
中图分类公共建筑;
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专利

1. Specific contact resistance measurements of the screen-printed Ag thick film contacts in the silicon solar cells by three-point probe methodology and TLM method [J] . P. N. Vinod Journal of materials science . 2011,第9期

机译：通过三点探针法和TLM方法测量硅太阳能电池中丝网印刷的Ag厚膜触点的比接触电阻
2. Specific contact resistance measurements of the screen-printed Ag thick film contacts in the silicon solar cells by three-point probe methodology and TLM method [J] . P. N. Vinod Journal of Materials Science: Materials in Electronics . 2011,第9期

机译：通过三点探针法和TLM方法测量硅太阳能电池中丝网印刷的Ag厚膜触点的比接触电阻
3. STLM: A Sidewall TLM Structure for Accurate Extraction of Ultralow Specific Contact Resistivity [J] . Majumdar, K., Vivekanand, IEEE Electron Device Letters . 2013,第9期

机译：STLM：用于精确提取超低比接触电阻率的侧壁TLM结构
4. Standardization of Specific Contact Resistivity Measurements using Transmission Line Model (TLM) [C] . Sidhant Grover, Shubham Sahu, Peng Zhang, International Conference on Microelectronic Test Structures . 2020

机译：使用传输线模型（TLM）的特定接触电阻率测量的标准化
5. Electromagnetic scattering from three dimensional gyrotropic objects using the Transmission Line Modeling (TLM) method. [D] . Yagli, Ahmet Fazil. 2006

机译：使用传输线建模（TLM）方法从三维回旋物体进行电磁散射。
6. Influence of Surface and Bulk Defects on Contactless Resistivity Measurements of CdTe and Related Compounds [O] . Jan Franc, Roman Grill, Jakub Zázvorka 2020

机译：表面和散装缺陷对CDTE和相关化合物非接触式电阻率测量的影响
7. Systematic TLM Measurements of NiSi and PtSi Specific Contact Resistance to n- and p-Type Si in a Broad Doping Range [O] . Stavitski, N., van Dal, M.J.H., Lauwers, A., 2008

机译：宽掺杂范围内对nSi和p型Si的NiSi和PtSi比接触电阻的系统TLM测量
8. Measurement and Extraction of Specific Contact Resistivity [R] . Saraswat, K. C.,, Loh, W. M., Schreyer, T. A., 1986

机译：特定接触电阻率的测量和提取

Effect of Transmission Line Measurement (TLM) Geometry on Specific Contact Resistivity Determination.

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