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Direct and inverse scattering problems for thin dielectric and partially coated objects.

机译:薄电介质和部分涂层物体的正向和反向散射问题。

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摘要

The inverse scattering problems arise in a variety of areas of science and in particular in the detection of objects in space and several aspects of material properties. Solving these problems requires the knowledge of the scattered waves near or far away from the object.;We first consider the inverse scattering problems of determining the shape and the material properties of the thin dielectric infinite cylinder having an open arc as cross section from knowledge of the TM-polarized scattered electromagnetic field at a fixed frequency. We develop two methods for solving the direct problem for thin dielectric infinite cylinder, namely an integral equation method and a variational method. We also investigate two reconstruction approaches, namely the linear sampling method and the reciprocity gap functional method, using far field or near field data, respectively. Numerical examples are given showing the efficaciousness of our algorithms.;We also consider the inverse scattering problem of detecting dielectric objects partially coated with a very thin layer of highly conductive material in the scalar case. Using the linear sampling method, we show that the approximate solution of the far field equation can be used to reconstruct the support of the coating in addition to the reconstruction of the shape of the scattering obstacle without any a priori information. Based on a detailed analysis of Green's function for several boundary value problems, we also deduce formulas providing point-wise reconstruction of the surface conductivity on the coated portion and the real index of refraction on the uncoated portion of the boundary. Numerical examples are given for the case with constant surface conductivity and index of refraction showing the viability of our reconstruction procedure.;In this thesis we also study the problem of distinguishing between a perfect conductor and a dielectric object partially coated by a thin highly conducting layer, of the same shape using multifrequency and multistatic data. Based in the theoretical results developed in [14] and [8], we present a numerical study of the identification problem.
机译:反散射问题出现在科学的各个领域,特别是在探测空间中的物体和材料特性的多个方面。解决这些问题需要了解物体附近或远离物体的散射波。我们首先考虑反散射问题,即从知识的基础上确定具有开放弧形截面的薄介电无限圆柱体的形状和材料特性。固定频率的TM极化散射电磁场。我们开发了两种方法来解决薄介质无限圆柱体的直接问题,即积分方程法和变分法。我们还研究了分别使用远场或近场数据的两种重构方法,即线性采样方法和互易性间隙函数方法。给出了数值示例,说明了我们算法的有效性。;我们还考虑了在标量情况下检测部分覆盖有非常薄的高导电材料层的电介质物体的逆散射问题。使用线性采样方法,我们表明,在没有任何先验信息的情况下,除了散射障碍物的形状重构之外,远场方程的近似解还可以用于重构涂层的支撑。在对几个边界值问题的格林函数进行了详细分析的基础上,我们还推导了公式,该公式提供了涂层部分的表面电导率和边界未涂层部分的实际折射率的逐点重构。给出了具有恒定表面电导率和折射率的情况的数值示例,表明了我们重建程序的可行性。在本论文中,我们还研究了区分理想导体和部分覆盖有薄高导电层的介电物体的问题使用多频和多静态数据具有相同形状。基于[14]和[8]中提出的理论结果,我们对识别问题进行了数值研究。

著录项

  • 作者

    Zeev, Noam.;

  • 作者单位

    University of Delaware.;

  • 授予单位 University of Delaware.;
  • 学科 Mathematics.
  • 学位 Ph.D.
  • 年度 2008
  • 页码 116 p.
  • 总页数 116
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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