首页> 中文期刊> 《物理学报》 >利用小角X射线散射技术研究组分对聚酰亚胺/Al2O3杂化薄膜界面特性与分形特征的影响

利用小角X射线散射技术研究组分对聚酰亚胺/Al2O3杂化薄膜界面特性与分形特征的影响

         

摘要

Inorganic nano-composite polyimide (PI) films were prepared with the method of sol-gel. The interfacial situation and the fractal characteristics of PI films were investigated by small angle X-ray scattering (SAXS) using synchrotron radiation as X-ray source. SAXS results indicated that the scattering curves in the high-angle region have a negative slope,i. e., a negative deviation from Porod's law, which suggests that there are obvious interface layers between the organic phase and the inorganic phase in the PI films. The thicknesses of interface layers are 0. 54-1. 48 nm. The interaction of the organic phase and inorganic phase becomes stronger and the thickness of interfacial layer increases with the increase of inorganic nano-components. Nano-particles have mass fractal, simultaneously have surface fractal structure, and their distribution and assemblage are nonlinear dynamic processes. With the inorganic nano-components increasing, the surface fractal dimension increases and mass fractal dimension decreases, which shows that the nano-particles structure becomes looser and mass distribution becomes more uneven. The anchoring action of polymer chains is enhanced and the number of anchored point increased respectively, the surface of the hybrid PI films becomes rougher. Finally, according to the interface characteristics of hybrid PI films, the relationship of the breakdown field strength with component is analyzed by percolation theory and polarization theory.%采用溶胶-凝胶方法制备无机纳米杂化聚酰亚胺(PI),应用同步辐射小角X射线散射(SAXS)方法研究不同组分杂化PI薄膜的界面特性与分形特征.研究结果表明:散射曲线不遵守Porod定理,形成负偏离,说明薄膜中有机相与Al2O3纳米颗粒间存在界面层,界面层厚度在0.54 nm到1.48 nm范围内;随无机纳米组分增加,界面层厚度增加,有机相与无机相作用变强;无机纳米颗粒同时具有质量分形和表面分形特征,其分布、集结是一种非线性动力学过程;随组分增加,其质量分形维数降低,表面分形维数升高,即纳米颗粒结构变疏松、质量分布变得不均匀,有机高分子链对无机纳米颗粒锚定作用加强且锚点数增加,表面变得更加粗糙.最后,利用逾渗理论与介质的电极化理论,结合杂化PI界面特性,解析了组分对杂化薄膜击穿场强的影响.

著录项

  • 来源
    《物理学报》 |2011年第5期|511-516|共6页
  • 作者单位

    哈尔滨理工大学应用科学学院,哈尔滨,150080;

    黑龙江科技学院实训中心,哈尔滨,150027;

    哈尔滨理工大学应用科学学院,哈尔滨,150080;

    工程电介质及其应用技术教育部重点实验室,哈尔滨,150080;

    中国科学院高能物理研究所同步辐射室,北京,100049;

    哈尔滨理工大学应用科学学院,哈尔滨,150080;

    哈尔滨理工大学应用科学学院,哈尔滨,150080;

    中国科学院高能物理研究所同步辐射室,北京,100049;

  • 原文格式 PDF
  • 正文语种 chi
  • 中图分类
  • 关键词

    小角X射线散射; 纳米杂化; 聚酰亚胺; 界面;

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