首页> 中文期刊> 《物理学前沿:英文版》 >Visualizing quantum phenomena at complex oxide interfaces:An atomic view from scanning transmission electron microscopy

Visualizing quantum phenomena at complex oxide interfaces:An atomic view from scanning transmission electron microscopy

         

摘要

Complex oxide interfaces have been one of the central focuses in condensed matter physics and ma-terial science.Over the past decade,aberration corrected scanning transmission electron microscopy and spectroscopy has proven to be invaluable to visualize and understand the emerging quantum phenomena at an interface.In this paper,we briefly review some recent progress in the utilization of electron microscopy to probe interfaces.Specifically,we discuss several important challenges for electron microscopy to advance our understanding on interface phenomena,from the perspective of variable temperature,magnetism,electron energy loss spectroscopy analysis,electronic symmetry,and defects probing.

著录项

相似文献

  • 中文文献
  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号