针对光耦器件可靠性筛选，提出全频段阈值筛选方法检测光耦器件内部低频噪声。根据光耦器件内部的低频噪声完成光耦器件可靠性的筛选。实验中利用光耦器件测试系统检测200只光耦器件内部的低频噪声，计算这200只光耦器件全频段平均噪声谱，确定筛选的阈值，再根据光耦器件可靠性分类标准，判断被测器件可靠性等级。%The theoretical analysis of low-frequency( LF) noise sources in Optoelectronic Coupled Devices( OCDs) is given. According to LF noise sources of OCDs and device reliability estimation methods, a novel measurement system based on virtual instrument for OCDs is introduced and nV-level measurement precision can be achieved with the typical LF noise measurement system,which can be used to screen potential devices with excess noise and assess device relibility classifications. In this experiment,the top and bottom limitative thresholds were used to esti-mate the components parameters of the PSD for estimating the reliability of OCDs by the average noise power spec-trum density( PSD) for 200 OCDs and the classification criterions of electronic components. The experimental results demonstrated that high reliability requirements can be satisfied.
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