首页> 中文期刊> 《电子工业专用设备》 >光学检测系统的优化和评估的新方法

光学检测系统的优化和评估的新方法

         

摘要

The value of an automated optical inspection (AOI) system for PCB manufacturers increases with its ability to detect significant, failure-causing defects, while ignoring non-significant manufacturing variations and cosmetic phenomena. But this ability can be fully realized only if the system is properly set up for the specific application being inspected.This paper presents a novel method for measuring the detection performance of the AOI system.This method points the user to the optimal setup where both missed zefects (under-detection) and false alarms (over-detection) are minimized.The method takes into account the costs of a missed defect and a false alarm, such that the resulting setup is optimal for the relative cost consideration of the specific application.A discussion of the schematic mechanism of decision making in automated inspection helps to explain the theoretical foundation of the method. A practical tool that allows a simple implementation of the method on the production floor is also described.%PCB厂商使用自动光学检测仪的目的是为了检测到重要的缺陷,而对于一些特殊设计和装饰性设计则不需要检测.如果要达到这一效果,就必须适当调整系统的检测参数.提供一种衡量AOI侦测性能的新颖方法.此种方法可以尽可能的减少漏测或误报产生的几率.通过考量漏测与误报的各自的成本,客户可据此结果来决定特定的机器的配备.关于自动检测设备选型机制示意图和方法,相关的实用工具及生产领域的简易实施方法也作了说明.

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