The microstructure of a fine-grained 16.5mol% CeO2 stabilized tetragonal zirconia polycrystal (Ce-TZP has been investigated by TEM and it is shown that the mi-crostructures of samples fractured at 298, 77 and 4.2 K change significantly. At 298K there is no stress-induced martensite but a few anti-phase boundaries (APBs) in tetragonal (t) parent phase. With a decrease in temperature, monoclinic (m) product or mariensite within retained t-phase appears. The morphologies are characterized as lenticular and block-like at 77 K and as lenticular and butterfly-like at 4.2 K. The relationship between microstructure and mechanical properties is also discassed in this paper.
展开▼
机译：利用扫描穿隧显微镜探讨在硒化铟上未氧化表面和氧化表面之介面接合处的电子特性 =Scanning Tunneling Microscope study of InSe Surface Electronic Properties at the Fresh/Oxided Interface Junction
