In order to meet the demand of manipulation and physical measurement of an individual nanostructure ,a scanning probe microscope had been built inside a transmission electron microscope , by w hich nanomanipulation ,physical measurement and in‐situ structural characterization could be re‐alized .This instrument was powerful in a way that it could directly correlate the atomic‐scale struc‐ture with the unique properties of low‐dimensional materials .%为了满足单个纳米结构的操纵和物理测量需求，设计制作了透射电子显微镜内置扫描探针装置，实现了纳米操纵、物性测量和原位结构表征的功能，从而建立起低维材料独特性质与其本征结构的一一对应关系。
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