介绍了硅漂移(SDD)探测器在X荧光分析系统中的应用,与SI-PIN探测器在能量分辨率、计数率等性能指标上的对比,以及在系统检出限上的实验对比,SDD探测器在性能指标及检出限上有着较大的优势。% In this paper, the application of silicon drift detector (SDD) in the X-ray fluorescence (XRF) analysis system was mostly discussed. Compared with SI-PIN detector at the key performance parameter like energy resolution and count rates, and also on the detection limit, the SDD detector had a larger advantage.
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