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The Microstructural Characterization of Multiferroic LaFeO3-YMnO3 Multilayers Grown on (001)- and (111)-SrTiO3 Substrates by Transmission Electron Microscopy

机译：（001）-和（111）-SrTiO3衬底上生长的多铁性LaFeO3-YMnO3多层膜的显微结构表征

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摘要

The microstructure of multiferroic LaFeO3-YMnO3 (LFO-YMO) multilayers grown on (001)- and (111)-SrTiO3 substrates is characterized by the transmission electron microscopy (TEM). Detailed TEM characterization reveals that LFO-YMO multilayers grown on both substrates have clear layer-by-layer morphology and distinct chemical-composition layered structure. The most notable feature is that LFO-YMO multilayers grown on (001)-SrTiO3 substrate have three types of domains, while those on (111)-SrTiO3 have only one. The multi-/twin- domain structure can be qualitatively explained by the lattice mismatch in this system. The details of the domain structure of LFO-YMO multilayers are crucial to understanding their magnetic properties.

机译：在（001）-和（111）-SrTiO3衬底上生长的多铁性LaFeO3-YMnO3（LFO-YMO）多层膜的显微结构由透射电子显微镜（TEM）表征。详细的TEM表征表明，在两种基材上生长的LFO-YMO多层均具有清晰的逐层形态和独特的化学组成分层结构。最显着的特征是，在（001）-SrTiO3衬底上生长的LFO-YMO多层具有三种类型的畴，而在（111）-SrTiO3上生长的LFO-YMO多层只有一种。可以通过该系统中的晶格失配来定性地解释多域/双域结构。 LFO-YMO多层晶体的畴结构细节对于理解其磁性至关重要。

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期刊名称 Materials
作者
Bin Pang; Lei Sun; Xuan Shen; Yang-Yang Lv; Xiao Li; Fei-Xiang Wu; Shu-Hua Yao; Jian Zhou; Shan-Tao Zhang; Y.B. Chen;
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作者单位

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年(卷),期 2017(10),7
年度 2017
页码 839
总页数 13
原文格式 PDF
正文语种
中图分类外科学;
关键词
multiferroic multilayers transmission electron microscopy domain structure;

机译：多铁性;多层;透射电镜;畴结构;

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专利

1. The Microstructural Characterization of Multiferroic LaFeO 3 -YMnO 3 Multilayers Grown on (001)- and (111)-SrTiO 3 Substrates by Transmission Electron Microscopy [J] . Bin Pang, Lei Sun, Xuan Shen, Materials . 2017,第7期

机译：通过透射电子显微镜通过透射电子显微镜在（001） - 和（111）-SRTIO 3基板上生长的多二二二二二二二二二二二聚体3- ymno 3多层的微观结构表征
2. Structural investigations of SiGe epitaxial layers grown by molecular beam epitaxy on Si(001) and Ge(001) substrates: Ⅱ-Transmission electron microscopy and atomic force microscopy [J] . N. Faleev, N. Sustersic, N. Bhargava, Journal of Crystal Growth . 2013,第FEBa15期

机译：通过分子束外延在Si（001）和Ge（001）衬底上生长的SiGe外延层的结构研究：Ⅱ-透射电子显微镜和原子力显微镜
3. Transmission electron microscopy study of microstructural properties and dislocation characterization in the GaN film grown on the cone-shaped patterned Al2O3 substrate. [J] . Jung Sik Park, Jun-Mo Yang, Kyung Jin Park, Microscopy . 2014,第1期

机译：透射电子显微镜研究在锥形图案化的Al2O3衬底上生长的GaN膜的微观结构特性和位错特征。
4. Study by transmission electron microscopy of GalnSb layers grown on (001) GaAs substrates by molecular beam epitaxy [C] . G Aragon, M J de Castro, J J Perez-Camacho, Institute of Physics Conference on Microscopy and Semiconducting Materials . 1995

机译：通过分子束外延在（001）GaAs基材上生长的Galnsb层的透射电子显微镜研究
5. Growth of Iridium on Germanium(111) and Germanium(110) and Growth of Silver on Germanium(111), Germanium(110), and Germanium(001) Studied by Low Energy Electron Microscopy and Scanning Tunneling Microscopy [D] . Mullet, Cory Hostetler 2012

机译：低能电子显微镜和扫描隧道显微镜研究锗在锗（111）和锗（110）上的生长以及锗（111），锗（110）和锗（001）上的银的生长
6. Ferromagnetism and Ru-Ru distance in SrRuO3 thin film grown on SrTiO3 (111) substrate [O] . Bowha Lee, O-Ung Kwon, Ran Hee Shin, 2014

机译：SrTiO3（111）衬底上生长的SrRuO3薄膜中的铁磁性和Ru-Ru距离
7. The Microstructural Characterization of Multiferroic LaFeO3-YMnO3 Multilayers Grown on (001)- and (111)-SrTiO3 Substrates by Transmission Electron Microscopy [O] . Bin Pang, Lei Sun, Xuan Shen, 2017

机译：通过透射电子显微镜通过透射电子显微镜在（001） - 和（111）-SRTIO3基板上生长的多二二二二二二二二二二二二聚体的微观结构表征
8. (abstract) Transmission Electron Microscopy of Al(sub x)Ga(sub 1-x)N/SiC Multilayer Structures Grown on Sapphire Substrates [R] . Pike, W. T., George, T., Khan, M. A., 1994

机译：（摘要）蓝宝石衬底上生长的al（sub x）Ga（sub 1-x）N / siC多层结构的透射电子显微镜

The Microstructural Characterization of Multiferroic LaFeO3-YMnO3 Multilayers Grown on (001)- and (111)-SrTiO3 Substrates by Transmission Electron Microscopy

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