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首页> 美国卫生研究院文献>Micromachines >Universal Testing Apparatus Implementing Various Repetitive Mechanical Deformations to Evaluate the Reliability of Flexible Electronic Devices
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Universal Testing Apparatus Implementing Various Repetitive Mechanical Deformations to Evaluate the Reliability of Flexible Electronic Devices

机译：通用测试设备实现各种重复的机械变形以评估柔性电子设备的可靠性

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摘要

A requirement of flexible electronic devices is that they maintain their electrical performance during and after repetitive mechanical deformation. Accordingly, in this study, a universal test apparatus is developed for in-situ electrical conductivity measurements for flexible electrodes that are capable of applying various mechanical deformations such as bending, twisting, shearing, sliding, stretching, and complex modes consisting of two simultaneous deformations. A novel method of deforming the specimen in an arc to induce uniform bending stress in single and alternating directions is also proposed with a mathematically derived control method. As an example of the arc bending method, the changes in the resistance of the printed radio frequency identification (RFID) tag antennas were measured by applying repetitive inner bending, outer bending, and alternating inner-outer bending. After 5000 cycles, the increases in resistance of the specimens that were subjected to inner or outer bending only were under 30%; however, specimens that were subjected to alternating inner-outer bending showed an increase of 135% in resistance. It is critical that the reliability of flexible electronic devices under various mechanical deformations be determined before they can be commercialized. The proposed testing apparatus can readily provide various deformations that will be useful to inform the design of device shapes and structures to accommodate deformations during use.
机译：柔性电子设备的要求是它们在重复的机械变形期间和之后保持其电气性能。因此，在这项研究中，开发了一种通用测试设备，用于柔性电极的原位电导率测量，该柔性电极能够施加各种机械变形，例如弯曲，扭曲，剪切，滑动，拉伸以及由两个同时变形组成的复杂模式。还提出了一种通过数学推导的控制方法使试样在弧中变形以在单个方向和交替方向上引起均匀弯曲应力的新颖方法。作为弧形弯曲方法的一个示例，通过应用重复的内部弯曲，外部弯曲和交替的内部-外部弯曲来测量印刷的射频识别（RFID）标签天线的电阻变化。在5000次循环后，仅经受内弯曲或外弯曲的试样的电阻增加不到30％；但是，经受内外交替弯曲的试样的电阻增加了135％。至关重要的是要确定柔性电子设备在各种机械变形下的可靠性，然后才能将其商业化。所提出的测试设备可以容易地提供各种变形，这将有助于告知装置形状和结构的设计以适应使用期间的变形。

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