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A beam branching method for timing and spectral characterization of hard X-ray free-electron lasers

机译:用于硬X射线自由电子激光器的定时和光谱表征的分束方法

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摘要

We report a method for achieving advanced photon diagnostics of x-ray free-electron lasers (XFELs) under a quasi-noninvasive condition by using a beam-splitting scheme. Here, we used a transmission grating to generate multiple branches of x-ray beams. One of the two primary diffracted branches (+1st-order) is utilized for spectral measurement in a dispersive scheme, while the other (−1st-order) is dedicated for arrival timing diagnostics between the XFEL and the optical laser pulses. The transmitted x-ray beam (0th-order) is guided to an experimental station. To confirm the validity of this timing-monitoring scheme, we measured the correlation between the arrival timings of the −1st and 0th branches. The observed error was as small as 7.0 fs in root-mean-square. Our result showed the applicability of the beam branching scheme to advanced photon diagnostics, which will further enhance experimental capabilities of XFEL.
机译:我们报告了一种通过使用分束方案在准非侵入性条件下实现x射线自由电子激光器(XFEL)的高级光子诊断的方法。在这里,我们使用了透射光栅来生成X射线束的多个分支。两个主衍射分支之一(+1阶)用于色散方案中的光谱测量,而另一个主分支(-1阶)专用于XFEL和光学激光脉冲之间的到达时间诊断。透射的X射线光束(0阶)被引导到实验站。为了确认此时序监视方案的有效性,我们测量了第-1和第0分支的到达时序之间的相关性。观测到的误差的均方根值小至7.0 fs。我们的结果表明,光束分支方案可用于高级光子诊断,这将进一步增强XFEL的实验能力。

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