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Environmentally friendly method to grow wide-bandgap semiconductor aluminum nitride crystals: Elementary source vapor phase epitaxy

机译:生长宽带隙半导体氮化铝晶体的环保方法:基本源气相外延

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摘要

Aluminum nitride (AlN) has attracted increasing interest as an optoelectronic material in the deep ultraviolet spectral range due to its wide bandgap of 6.0 eV (207 nm wavelength) at room temperature. Because AlN bulk single crystals are ideal device substrates for such applications, the crystal growth of bulky AlN has been extensively studied. Two growth methods seem especially promising: hydride vapor phase epitaxy (HVPE) and sublimation. However, the former requires hazardous gases such as hydrochloric acid and ammonia, while the latter needs extremely high growth temperatures around 2000 °C. Herein we propose a novel vapor-phase-epitaxy-based growth method for AlN that does not use toxic materials; the source precursors are elementary aluminum and nitrogen gas. To prepare our AlN, we constructed a new growth apparatus, which realizes growth of AlN single crystals at a rate of ~18 μm/h at 1550 °C using argon as the source transfer via the simple reaction Al + 1/2N2 → AlN. This growth rate is comparable to that by HVPE, and the growth temperature is much lower than that in sublimation. Thus, this study opens up a novel route to achieve environmentally friendly growth of AlN.
机译:氮化铝(AlN)由于在室温下具有6.0?eV(207?nm波长)的宽带隙,在深紫外光谱范围内作为光电材料引起了越来越多的兴趣。由于AlN块状单晶是此类应用的理想器件衬底,因此对AlN块状晶体的生长进行了广泛的研究。两种生长方法似乎特别有前途:氢化物气相外延(HVPE)和升华。但是,前者需要有害气体,例如盐酸和氨气,而后者则需要2000 growth°C左右的极高生长温度。在这里,我们提出了一种新的基于气相外延的AlN生长方法,该方法不使用有毒材料。源前体是元素铝和氮气。为了制备我们的AlN,我们构造了一种新的生长装置,该装置通过简单的Al + 1 / 2N2→AlN反应,以氩作为源转移,在1550°C下以〜18μm/ h的速率实现AlN单晶的生长。该生长速率与HVPE相当,并且生长温度远低于升华的生长温度。因此,这项研究开辟了一条新的途径来实现AlN的环境友好型增长。

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