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Competition between surface modification and abrasive polishing: a method of controlling the surface atomic structure of 4H-SiC (0001)

机译:表面改性和磨料抛光之间的竞争:控制4H-SiC表面原子结构的方法(0001)

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摘要

The surface atomic step-terrace structure of 4H-SiC greatly affects its performance in power device applications. On the basis of the crystal structure of 4H-SiC, we propose the generation mechanism of the a-b-a*-b* type, a-b type and a-a type step-terrace structures. We demonstrate that the step-terrace structure of SiC can be controlled by adjusting the balance between chemical modification and physical removal in CeO2 slurry polishing. When chemical modification plays the main role in the polishing of SiC, the a-b-a*-b* type step-terrace structure can be generated. When the roles of physical removal and chemical modification have similar importance, the a-b-a*-b* type step-terrace structure changes to the a-b type. When physical removal is dominant, the uniform a-a type step-terrace structure can be generated.
机译:4H-SiC的表面原子台阶结构会极大地影响其在功率器件应用中的性能。在4H-SiC晶体结构的基础上,提出了a-b-a * -b *型,a-b型和a-a型阶梯形阶梯结构的生成机理。我们证明,可以通过调整化学改性和CeO2浆料抛光中的物理去除之间的平衡来控制SiC的阶梯状结构。当化学改性在SiC的抛光中起主要作用时,可以生成a-b-a * -b *型阶梯状阶梯结构。当物理去除和化学修饰的作用具有相似的重要性时,a-b-a * -b *型阶梯式阶梯结构变为a-b型。当物理去除占主导地位时,可以生成均匀的a-a型阶差结构。

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