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The Effects of Grain Boundaries on the Current Transport Properties in YBCO-Coated Conductors

机译:晶界对YBCO涂层导体中电流输运性能的影响

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摘要

We report a detailed study of the grain orientations and grain boundary (GB) networks in Y2O3 films grown on Ni-5 at.%W substrates. Electron back scatter diffraction (EBSD) exhibited different GB misorientation angle distributions, strongly decided by Y2O3 films with different textures. The subsequent yttria-stabilized zirconia (YSZ) barrier and CeO2 cap layer were deposited on Y2O3 layers by radio frequency sputtering, and YBa2Cu3O7-δ (YBCO) films were deposited by pulsed laser deposition. For explicating the effects of the grain boundaries on the current carry capacity of YBCO films, a percolation model was proposed to calculate the critical current density (Jc) which depended on different GB misorientation angle distributions. The significantly higher Jc for the sample with sharper texture is believed to be attributed to improved GB misorientation angle distributions.
机译:我们报告了在Ni-5 at.W衬底上生长的Y2O3薄膜中晶粒取向和晶界(GB)网络的详细研究。电子背散射衍射(EBSD)表现出不同的GB取向差角分布,这主要由具有不同纹理的Y2O3薄膜决定。随后通过射频溅射在Y2O3层上沉积氧化钇稳定的氧化锆(YSZ)阻挡层和CeO2盖层,并通过脉冲激光沉积法沉积YBa2Cu3O7-δ(YBCO)膜。为了阐明晶界对YBCO薄膜载流能力的影响,提出了一种渗流模型来计算临界电流密度(Jc),其取决于不同的GB取向角分布。据信具有较清晰纹理的样品的Jc明显较高,这归因于改善的GB取向角分布。

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