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首页> 美国卫生研究院文献>Polymers >Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology
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Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology

机译：通过放牧入射率小角X射线散射（吉安斯）技术用170keV质子照射聚醚醚酮膜的微观结构研究

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Polyether ether ketone (PEEK) films irradiated with 170 keV protons were calculated by the stopping and ranges of ions in matter (SRIM) software. The results showed that the damage caused by 170 keV protons was only several microns of the PEEK surface, and the ionization absorbed dose and displacement absorbed dose were calculated. The surface morphology and roughness of PEEK after proton irradiation were studied by atomic force microscope (AFM). GISAXS was used to analyze the surface structural information of the pristine and irradiated PEEK. The experimental results showed that near the surface of the pristine and irradiated PEEK exists a peak, and the peak gradually disappeared with the increasing of the angles of incidence and the peak changed after irradiation, which implies the 170 keV protons have an effect on PEEK structure. The influences of PEEK irradiated with protons on the melting temperature and crystallization temperature was investigated by differential scanning calorimetry (DSC). The DSC results showed that the crystallinity of the polymer after irradiation decreased. The structure and content of free radicals of pristine and irradiated PEEK were studied by Fourier transform infrared spectroscopy (FTIR) and electron paramagnetic resonance (EPR). The stress and strain test results showed that the yield strength of the PEEK irradiated with 5 × 1015 p/cm2 and 1 × 1016 p/cm2 was higher than the pristine, but the elongation at break of the PEEK irradiated with 5 × 1015 p/cm2 and 1 × 1016 p/cm2 decreased obviously.
机译：用170keV质子照射的聚醚醚酮（PEEK）薄膜通过物质（SRIM）软件的离子和范围来计算。结果表明，由170keV质子引起的损伤仅为几微米的PEEK表面，并计算吸收的剂量和位移剂量的电离。通过原子力显微镜（AFM）研究了质子辐射后PEEK的表面形态和粗糙度。吉亚斯用于分析原始和照射偷看的表面结构信息。实验结果表明，在原始和照射的垂直的表面附近存在峰值，并且峰值随着入射角的增加而逐渐消失，辐射后的峰值改变，这意味着170keV质子对PEEK结构有影响。通过差示扫描量热法（DSC）研究了在熔融温度和结晶温度上照射质子的PEEP对质子的影响。 DSC结果表明，辐照后聚合物的结晶度降低。通过傅里叶变换红外光谱（FTIR）和电子顺磁共振（EPR）研究了原始和辐照的自由基的结构和含量。应力和应变试验结果表明，用5×1015p / cm2和1×1016p / cm2照射的PEEK的屈服强度高于原始，但是用5×1015 p /的PEEK断裂处的伸长率CM2和1×1016p / cm2明显下降。

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