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Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au Pd Pt Cu and Ir

机译:使用使用AuPdPtCu和IR和IR和IR的MACE方法自对准高纵横比硅3D结构的晶圆级集成

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摘要

The wafer-level integration of high aspect ratio silicon nanostructures is an essential part of the fabrication of nanodevices. Metal-assisted chemical etching (MACE) is a promising low-cost and high-volume technique for the generation of vertically aligned silicon nanowires. Noble metal nanoparticles were used to locally etch the silicon substrate. This work demonstrates a bottom-up self-assembly approach for noble metal nanoparticle formation and the subsequent silicon wet etching. The macroscopic wafer patterning has been done by using a poly(methyl methacrylate) masking layer. Different metals (Au, Pt, Pd, Cu, and Ir) were investigated to derive a set of technologies as platform for specific applications. Especially, the shape of the 3D structures and the resulting reflectance have been investigated. The Si nanostructures fabricated using Au nanoparticles show a perfect light absorption with a reflectance below 0.3%. The demonstrated technology can be integrated into common fabrication processes for microelectromechanical systems.
机译:高纵横比硅纳米结构的晶片级集成是纳米型制造的必要部分。金属辅助化学蚀刻(MACE)是一种很有希望的低成本和高容量技术,用于产生垂直对齐的硅纳米线。使用贵金属纳米颗粒用于局部蚀刻硅衬底。这项工作显示了贵金属纳米粒子形成和随后的硅湿法蚀刻的自下而上的自组装方法。已经通过使用聚(甲基丙烯酸甲酯)掩模层来完成宏观晶片图案化。研究了不同的金属(AU,PT,PD,Cu和IR),以导出一组技术作为特定应用的平台。特别是,研究了3D结构的形状和所得到的反射率。使用Au纳米粒子制造的Si纳米结构显示出完美的光吸收,反射率低于0.3%。所示技术可以集成到微机电系统的共同制造工艺中。

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