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Making Large-Area Titanium Disulfide Films at Reduced Temperature by Balancing the Kinetics of Sulfurization and Roughening

机译:通过平衡硫化和粗糙化的动力学,在降低温度下制造大面积的二硫化物薄膜

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摘要

The synthesis of large-area TiS(2)thin films is reported at temperatures as low as 500 degrees C using a scalable two-step method of metal film deposition followed by sulfurization in an H2S gas furnace. It is demonstrated that the lowest-achievable sulfurization temperature depends strongly on the oxygen background during sulfurization. This dependence arises because Ti-O bonds present a substantial kinetic and thermodynamic barrier to TiS(2)formation. Lowering the sulfurization temperature is important to make smooth films, and to enable integration of TiS(2)and related transition metal dichalcogenides-including metastable phases and alloys-into device technology.
机译:使用可伸缩的金属膜沉积的可伸缩的两步方法,在低至500摄氏度的温度下,在低至500摄氏度的温度下,在H 2 S气体炉中进行硫化,将大面积TIS(2)薄膜的合成。结果证明,在硫化期间,可实现的硫化温度最低依赖于氧气背景。出现这种依赖性,因为Ti-O键在TIS(2)形成的基本动力学和热力学屏障上。降低硫化温度对于制造光滑的薄膜是重要的,并且能够将TIS(2)和相关的过渡金属二甲基化物的整合 - 包括亚稳态阶段和合金 - 进入器件技术。

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