机译:扫描探针应用的耐磨纳米碳化硅刀头
IBM Research-Zurich, Saumerstrasse 4, Riischlikon, CH8803 Switzerland;
IBM Research-Zurich, Saumerstrasse 4, Riischlikon, CH8803 Switzerland;
Department of Mechanical Engineering and Applied Mechanics University of Pennsylvania 220 S. 33rd St., Philadelphia, PA 19104, USA;
Department of Materials Science and Engineering University of Pennsylvania 3231 Walnut St., Philadelphia, PA 19104, USA;
Department of Engineering Physics University of Wisconsin 1500 Engineering Drive, Madison, Wl 53706, USA;
Department of Engineering Physics University of Wisconsin 1500 Engineering Drive, Madison, Wl 53706, USA;
Department of Mechanical Engineering and Applied Mechanics University of Pennsylvania 220 S. 33rd St., Philadelphia, PA 19104, USA;
机译:纳米制造用耐磨碳化硅工具
机译:用扫描电容力显微镜对碳化硅双扩散MOSFET进行纳米级研究
机译:污染物在超高真空下硬质合金涂层扫描探针尖端和Pt(111)的附着力,摩擦和导电特性变化中的作用
机译:用于高速表面粗糙度扫描设备的耐磨硅微探针针尖的制造
机译:用于扫描探针显微镜的碳纳米管尖端的受控生长和应用。
机译:使用扫描电化学显微镜超薄纳米多孔膜作为探索sun Yatsen的离子选择透过性微量吸管支持的ITIEs提示
机译:污染物在超高真空下硬质合金涂层扫描探针尖端和Pt(111)的附着力,摩擦和导电特性变化中的作用
机译:用于高级热机应用的将碳化硅与碳化硅和氮化硅连接到氮化硅的分析和实验评估阶段2.最终报告