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Single-Crystalline Films of the Homologous Series InGaO_3(ZnO)_m Grown by Reactive Solid-Phase Epitaxy

机译:反应性固相外延生长的InGaO_3(ZnO)_m同源系列单晶薄膜

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摘要

Single-crystalline thin films of the homologous series InGaO_3(ZnO)_m (where m is an integer) are fabricated by the reactive solid-phase epitaxy (R-SPE) method. Specifically, the role of ZnO as epitaxial initiator layer for the growth mechanism is clarified. High-temperature annealing of bilayer films consisting of an amorphous InGaO_3(ZnO)_5 layer deposited at room temperature and an epitaxial ZnO layer on yttria-stabilized zirconia (YSZ) substrate allows for the growth of single-crystalline film with controlled chemical composition. The epitaxial ZnO thin layer plays an essential role in determining the crystallographic orientation, while the ratio of the thickness of both layers controls the film composition.
机译:通过反应性固相外延(R-SPE)法制造同源系列InGaO_3(ZnO)_m(其中m是整数)的单晶薄膜。具体而言,明确了ZnO作为外延引发剂层的生长机理的作用。由在室温下沉积的非晶InGaO_3(ZnO)_5层和氧化钇稳定的氧化锆(YSZ)衬底上的外延ZnO层组成的双层膜的高温退火可以使化学成分受控的单晶膜生长。外延ZnO薄层在确定晶体取向方面起着至关重要的作用,而两层的厚度之比控制着膜的组成。

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