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How Accurate MIL-STD-883E Helium Bomb and Bubble Test Methods Are for Small Cavity Chip-scale MEMS Packages

机译:MIL-STD-883E氦气炸弹和气泡测试方法如何适用于小腔芯片级MEMS封装

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摘要

In the present study, a gas flow model is used to show that the helium bomb test and bubble test methods in MIL-STD-883E are not applicable for hermeticity testing of packages with small internal volumes ( < 10-3cm3), typically encountered for microelectromechanical systems (MEMS). The reasons include inaccurate reading due to helium loss in dwell period, undefined regime in leak rate spectrum, and unpractical reject limit for small vacuum packages. The simulation results indicate the necessity to develop new test methods for hermeticity testing of MEMS packages, such as to integrate pressure sensors in the package.
机译:在本研究中,使用气体流动模型表明,MIL-STD-883E中的氦气炸弹测试和气泡测试方法不适用于内部体积较小(<10-3cm3)的包装的气密性测试,微机电系统(MEMS)。原因包括由于停留期间氦气损失导致读数不准确,泄漏率频谱的范围不确定以及小型真空包装的不实际废品限制。仿真结果表明,有必要开发新的测试方法来进行MEMS封装的气密性测试,例如将压力传感器集成到封装中。

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