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首页> 外文期刊>Applied Physics A: Materials Science & Processing >A non invasive method to detect stratigraphy, thicknesses and pigment concentration of pictorial multilayers based on EDXRF and vis-RS: in situ applications
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A non invasive method to detect stratigraphy, thicknesses and pigment concentration of pictorial multilayers based on EDXRF and vis-RS: in situ applications

机译：基于EDXRF和vis-RS的无创方法可检测图像多层的地层，厚度和颜料浓度：原位应用

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摘要

Energy dispersive XRF analysis (EDXRF) in association with visible reflectance spectroscopy (vis-RS), both achieved by portable instruments, can be successfully applied, in a wide range of cases, to investigate wood or canvas paintings in order to obtain some stratigraphic information with non-invasive techniques. The specific aim of this work is to use them as quantitative tools: EDXRF to reconstruct the thicknesses of the detected layers, vis-RS to report pigment concentration in the uppermost layer. The method has been tested in the laboratory on paint layers with different composition of about 50 multilayers and more than 100 single layers [12]. We present here some in situ analyses of famous paintings by Andrea Man-tegna and Giovanni Bellini, compared with stratigraphic optical microscopy observations on cross sections. Advantages and limits are pointed out.
机译：通过便携式仪器实现的能量色散XRF分析（EDXRF）与可见反射光谱法（vis-RS）结合使用，可以在广泛的情况下成功地应用于研究木材或帆布画，以获得一些地层信息与非侵入性技术。这项工作的特定目的是将它们用作定量工具：EDXRF重建检测到的层的厚度，VS-RS报告最上层的颜料浓度。该方法已在实验室中测试，该涂料具有约50个多层和100个以上单层的不同组成的油漆层[12]。我们在这里对安德烈亚·曼·特格纳（Andrea Man-tegna）和乔瓦尼·贝里尼（Giovanni Bellini）的著名绘画进行一些原位分析，并将其与横截面的地层光学显微镜观察进行比较。指出了优点和局限性。

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