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首页> 外文期刊>IEEE Transactions on Applied Superconductivity >Critical currents and pinning mechanisms in Chevrel-phasesuperconductors: materials science issues
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Critical currents and pinning mechanisms in Chevrel-phasesuperconductors: materials science issues

机译:Chevrel相超导体中的临界电流和钉扎机制:材料科学问题

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Critical current densities and pinning mechanisms in lead (PMS) and tin (SMS) molybdenum sulfides are reviewed with the emphasis on materials science problems. In both compounds, pinning at grain boundaries is dominant only in fine-grained materials and in the low-field regime. In coarser grained materials, additional pinning behaviors (the maximum pinning force density Fp at the reduced field bm=0.4-0.55 and 0.7) are reproducibly observed and can be related to pinning at intragrain defects (planar defects, oxide precipitates, and point-like defects). The difference in the critical currents in PMS and SMS is discussed and related to the difference in the extent of stress-induced structural transformation at grain boundaries
机译:综述了铅(PMS)和锡(SMS)硫化钼中的关键电流密度和钉扎机理,重点研究了材料科学问题。在这两种化合物中,钉扎在晶界仅在细颗粒材料和低场条件下占主导地位。在较粗的颗粒材料中,可重复观察到其他钉扎行为(在减小的磁场bm下的最大钉扎力密度Fp = 0.4-0.55和0.7),并且可能与钉扎在晶粒内缺陷(平面缺陷,氧化物沉淀和类似点)有关缺陷)。讨论了PMS和SMS中的临界电流的差异,并与晶界上应力引起的结构转变程度的差异有关

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