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Positron annihilation study on ZnO-based scintillating glasses

机译:ZnO基闪烁玻璃的正电子an灭研究

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摘要

Positron lifetime of ZnO-based scintillating glasses (55 - x)SiO_2-45ZnO-xBaF_2 (x - 5,10,15 mol%) were measured with a conventional fast-fast spectrometer. Three positron lifetime components τ_1, τ_2, and τ_3 are ~0.23 ns, ~0.45 ns, and ~1.6ns, respectively. All the three positron lifetime components first increase with increasing BaF_2 concentration from 5 mol% to 10mol%, then decreases as BaF_2 further increases to 15 mol%. The result suggests that the glass sample with 10 mol% BaF_2 contains the highest defect density, and is in excellent agreement with glass chemistry, glass density, thermal properties, and calculated crystallinity. Therefore, positron annihilation lifetime measurement is an effective tool for analyzing defects in ZnO-based scintillating glasses.
机译:使用常规的快速光谱仪测量ZnO基闪烁玻璃(55-x)SiO_2-45ZnO-xBaF_2(x-5,10,15 mol%)的正电子寿命。三个正电子寿命分量τ_1,τ_2和τ_3分别为〜0.23 ns,〜0.45 ns和〜1.6ns。所有三个正电子寿命成分首先随着BaF_2浓度从5 mol%增加到10 mol%而增加,然后随着BaF_2进一步增加到15 mol%而减少。结果表明,具有10 mol%BaF_2的玻璃样品含有最高的缺陷密度,并且与玻璃化学性质,玻璃密度,热性能和计算的结晶度极好一致。因此,正电子an灭寿命测量是分析ZnO基闪烁玻璃中缺陷的有效工具。

著录项

  • 来源
    《Applied Surface Science》 |2009年第14期|6551-6554|共4页
  • 作者单位

    Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 20023, China;

    Key Laboratory of Nuclear Analysis Techniques, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100039, China;

    Key Laboratory of Nuclear Analysis Techniques, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100039, China;

    Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 20023, China;

    Key Laboratory of Nuclear Analysis Techniques, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100039, China;

    School of Chemical Engineering, University of Adelaide, Adelaide, SA 5005, Australia;

    Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 20023, China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    defects; lifetime; glass; ZnO; nuclear applications;

    机译:缺陷一生;玻璃;氧化锌;核应用;

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