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Study of positron trapping at quantum-dot like copper particles on the surface of iron using positron annihilation induced auger electron spectroscopy.

机译:利用正电子an没诱导的螺旋电子能谱研究正电子在铁表面的量子点状铜颗粒上的俘获。

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摘要

Annihilation studies performed in bulk Fe-Cu alloy have demonstrated the trapping of positrons in quantum-dot like Cu nano-particles in Fe. This thesis presents the results of studies of sputtered surfaces of these materials using Positron annihilation-induced Auger electron spectroscopy (PAES). In PAES energetic electron emission results from Auger transitions initiated by annihilation of core electrons with positrons trapped in a surface-state. The Cu PASS intensities obtained from different films by deposition of Cu/Fe-Cu (quenched) alloy revealed that the 95% of Cu intensities come from the 0.56A of Cu/Fe-Cu (quenched) alloy. This suggests that the implanted positrons are trapped at Cu sites in the top most layer of the sample. The low Cu intensity observed in PAES measurements of the Cu-Fe (2h-aged) alloy is consistent with trapping of positrons implanted at low energies in Cu nano particles below the surface rather than at surface site.
机译:在块状Fe-Cu合金中进行的灭研究表明,正电子在量子点中像Fe中的Cu纳米粒子一样被俘获。本文介绍了使用正电子an没诱导俄歇电子能谱(PAES)研究这些材料的溅射表面的结果。在PAES中,高能电子发射是由铁原子跃迁引起的,俄歇跃迁是由核心电子with灭并以表面态捕获的正电子引发的。通过沉积Cu / Fe-Cu(淬火)合金而从不同膜获得的Cu PASS强度显示出95%的Cu强度来自0.56A的Cu / Fe-Cu(淬火)合金。这表明植入的正电子被困在样品最顶层的Cu位置。在Cu-Fe(2h时效)合金的PAES测量中观察到的低Cu强度与以低能注入的正电子在表面下方而不是表面部位的Cu纳米粒子中的俘获相一致。

著录项

  • 作者单位

    The University of Texas at Arlington.;

  • 授予单位 The University of Texas at Arlington.;
  • 学科 Physics Condensed Matter.
  • 学位 M.S.
  • 年度 2003
  • 页码 55 p.
  • 总页数 55
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 O49;
  • 关键词

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