首页> 外文期刊>Applied Surface Science >Initial Growth Mechanism Of Atomic Layer Deposition Of Zno On The Hydroxylated Si(100)-2×1: A Density Functional Theory Study
【24h】

Initial Growth Mechanism Of Atomic Layer Deposition Of Zno On The Hydroxylated Si(100)-2×1: A Density Functional Theory Study

机译:羟基化Si(100)-2×1上Zno原子层沉积的初始生长机理:密度泛函理论研究

获取原文
获取原文并翻译 | 示例
           

摘要

Density functional theory (DFT) is employed to investigate the initial growth mechanism of atomic layer deposition (ALD) of ZnO on the hydroxylated silicon surfaces. Both the diethylzinc (DEZn) and the H_2O half-reactions proceed through an analogous trapping-mediated mechanism. By comparison of the reactions on silicon surfaces with single and double hydroxyl sites, we find that the existence of neighboring hydroxyl can facilitate the adsorption of DEZn and lower the activation barrier. Also, we find that it is both thermodynamically and kinetically more favorable for the reactions on silicon surfaces with double hydroxyl sites. In addition, calculations show that the DEZn half-reaction is more favorable as compared to the H_2O half-reaction.
机译:采用密度泛函理论(DFT)研究了羟基化硅表面ZnO原子层沉积(ALD)的初始生长机理。二乙基锌(DEZn)和H_2O半反应均通过类似的捕获介导机制进行。通过比较具有单个和两个羟基位点的硅表面上的反应,我们发现相邻羟基的存在可以促进DEZn的吸附并降低活化势垒。而且,我们发现对于在具有双羟基位点的硅表面上的反应,热力学和动力学都更有利。另外,计算表明,与H_2O半反应相比,DEZn半反应更有利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号