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Polymer assisted assembling of the semiconductor particles: Structural and electrical studies

机译：聚合物辅助组装的半导体粒子：结构和电学研究

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摘要

CdS and Si semiconductor nanopraticles were embedded in a polymer matrix and characterized using various techniques. The surface properties and size distribution of the nanoparticles were monitored by POM and SEM and found to be uniform but around the crystalline frameworks of the polymer. XRD and FTIR analysis have been used to ensure the composite nature and particle size of the semiconductor loaded films. The electrical conductivity of these films were evaluated and found to increase with semiconductor dispersion and attains a percolation threshold at optimum composition. This composition and the distribution of the clusters is shown to vary with the type of the semiconductor, i.e., CdS or Si.
机译：将CdS和Si半导体纳米颗粒嵌入聚合物基质中，并使用各种技术进行表征。通过POM和SEM监测纳米颗粒的表面性质和尺寸分布，发现它们是均匀的，但是在聚合物的晶体框架周围。 XRD和FTIR分析已用于确保半导体负载膜的复合性质和粒径。对这些膜的电导率进行了评估，发现其随半导体扩散而增加，并在最佳组成下达到了渗滤阈值。簇的这种组成和分布显示出随半导体类型即CdS或Si的类型而变化。

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  • 来源
    《Applied Surface Science》 |2009年第2期|499-502|共4页
  • 作者

    Bhaskar Bhattacharya; Jun Young Lee; Jung-Ki Park;

  • 作者单位

    Korea Advanced Institute of Science and Technology, Republic of Korea Sharda Univeristy, Greater Noida, India Department of Physics, 32-34 Knowledge Park HI, Greater Noida 201306, India;

    Korea Advanced Institute of Science and Technology, Republic of Korea;

    Korea Advanced Institute of Science and Technology, Republic of Korea Department of Chemical and Biomoiecular Engineering, Yuseong-gu, Daejeon 305701, Korea;

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  • 原文格式 PDF
  • 正文语种 eng
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  • 关键词

    semiconductors; self-assembly; polymer; glass transition; composite;

    机译：半导体;自组装;聚合物;玻璃化转变;综合;

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