Atomic distribution in quantum dots- A ToF-SIMS study

Chen WY; Ling YC; Chen BJ; Wang CC

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Atomic distribution in quantum dots- A ToF-SIMS study

机译：量子点中的原子分布-ToF-SIMS研究

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The atomic distribution in the monolayer of two different Mn-doped US quantum dots (QDs) was studied first time with ToF-SIMS. The model Cd:Mn QDs were immobilized on Au substrate by use of a self-assembled monolayer via 1,10-decanedithiol. Morphological analysis by SPM and TEM indicates larger particle size of in situ synthesizing CdS:Mn. ToF-SIMS depth profile and 3D-images reveal that Mn atoms reside on the surface of in situ synthesizing CdS:Mn and are uniformly embedded in capped CdS:Mn. The results obtained by SPM, TEM, and ToF-SIMS are comparable, indicating that ToF-SIMS might find potential applications in surface and interface study of semiconductor nanocrystals. (c) 2006 Elsevier B.V. All rights reserved.

机译：首次使用ToF-SIMS研究了两个不同的Mn掺杂的美国量子点（QD）在单层中的原子分布。通过自组装单层通过1,10-癸二硫醇将模型Cd：Mn QDs固定在Au基底上。通过SPM和TEM进行的形态分析表明，原位合成CdS：Mn的粒径较大。 ToF-SIMS深度分布图和3D图像显示，Mn原子驻留在原位合成CdS：Mn的表面上，并均匀地嵌入封端的CdS：Mn中。通过SPM，TEM和ToF-SIMS获得的结果是可比的，表明ToF-SIMS可能在半导体纳米晶体的表面和界面研究中找到潜在的应用。（c）2006 Elsevier B.V.保留所有权利。

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来源
《Applied Surface Science》 |2006年第19期|p. 7003-7005|共3页
作者
Chen WY; Ling YC; Chen BJ; Wang CC;
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作者单位

Natl Tsing Hua Univ, Dept Chem, Hsinchu 30013, Taiwan;

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原文格式 PDF
正文语种 eng
中图分类应用物理学;
关键词
ToF-SIMS; CdS; immobilization; depth profile; image; NANOCRYSTALS;

机译：ToF-SIMS;CdS;固定化;深度剖面;图像;纳米晶体;

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Atomic distribution in quantum dots- A ToF-SIMS study

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