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PLA-PMMA blends: A study by XPS and ToF-SIMS

机译：PLA-PMMA混合物：XPS和ToF-SIMS的研究

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This paper reports which are the possibilities of quantification by time of flight secondary ion mass spectrometry (ToF-SIMS) for some polymer blends. In order to assess the composition of the mixtures, we studied first different poly(L-lactide)/polymethylmethacrylate (PLA/PMMA) blends by X-ray photoelectron spectroscopy (XPS), this technique being quantitative. By XPS fitting of the C Is level, we found a very good agreement of the measured concentrations with the initial compositions. Concerning ToF-SIMS data treatment, we used principal component analysis (PCA) on negative spectra allowing to discriminate one polymer from the other one. By partial least square regression (PLS), we found also a good agreement between the ToF-SIMS predicted and initial compositions. This shows that ToF-SIMS, in a similar way to XPS, can lead to quantitative results. In addition, the observed agreement between XPS (60-100 angstrom depth analyzed) and ToF-SIMS (10 angstrom depth analyzed) measurements show that there is no segregation of one of the two polymers onto the surface. (c) 2006 Elsevier B.V. All rights reserved.
机译：本文报道了通过飞行时间二次离子质谱（ToF-SIMS）对某些聚合物混合物进行定量的可能性。为了评估混合物的组成，我们首先通过X射线光电子能谱（XPS）研究了不同的聚（L-丙交酯）/聚甲基丙烯酸甲酯（PLA / PMMA）共混物，该技术是定量的。通过XPS对C Is水平的拟合，我们发现测得的浓度与初始成分非常吻合。关于ToF-SIMS数据处理，我们在负光谱上使用了主成分分析（PCA），从而可以将一种聚合物与另一种聚合物区分开。通过偏最小二乘回归（PLS），我们还发现了ToF-SIMS预测的成分和初始成分之间的良好一致性。这表明ToF-SIMS与XPS相似，可以得出定量结果。此外，观察到的XPS（分析的深度为100-100埃）和ToF-SIMS（分析的深度为10埃）之间的一致性表明，两种聚合物中的一种没有偏析在表面上。 （c）2006 Elsevier B.V.保留所有权利。

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