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Comparison of growth stress measurements with modelling in thin iron oxide films

机译:氧化铁薄膜中生长应力测量与建模的比较

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High temperature oxidation of metals leads to residual stresses both in the metal and in the growing oxide. In this work, the evolution of this residual stresses is theoretically predicted in the growing oxide layers. The origin of these stresses is based on a microstructural model. Using experimental results providing from the oxidation kinetics, and an analysis proposed to describe the growth strain occurring in the thin layers, a set of equations is established allowing determining the stresses evolution with oxidation time. Then, the model is compared with experimental results obtained on both alpha-Fe and phosphated alpha-Fe, oxidised at different temperatures. Numerical data are extracted from experiments either with an asymptotic formulation or with an inverse method. These two methods give good agreement with experiments and allow extracting the model parameters. (c) 2005 Elsevier B.V. All rights reserved.
机译:金属的高温氧化会导致金属和正在生长的氧化物中的残余应力。在这项工作中,从理论上预测了正在生长的氧化物层中残余应力的演变。这些应力的起源是基于微观结构模型。利用由氧化动力学提供的实验结果,并提出了描述薄层中发生的生长应变的分析方法,建立了一组方程,可以确定应力随氧化时间的变化。然后,将模型与在不同温度下氧化的α-Fe和磷酸化α-Fe的实验结果进行比较。使用渐近公式或反方法从实验中提取数值数据。这两种方法与实验具有很好的一致性,并且可以提取模型参数。 (c)2005 Elsevier B.V.保留所有权利。

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