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Double-layer stepped Si(100) surfaces prepared in As-rich CVD ambience

机译:在富砷CVD环境中制备的双层阶梯式Si(100)表面

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摘要

Low-defect III-V integration on Si(1 0 0) requires atomically well-ordered heterointerfaces. To this end, we study the interaction of As with Si(1 0 0) surfaces and the formation of dimerized Si(1 0 0): As surfaces in situ with reflection anisotropy spectroscopy during metalorganic chemical vapor deposition (MOCVD). Control of surface processes allows us to intentionally 'rotate' the dimer orientation and choose between predominantly (1x2) and (2x1) reconstructed Si(1 0 0): As surfaces both for low and higher surface misorientation. We also verify that the (2x1) surface reconstruction becomes energetically more favorable for vicinal Si(1 0 0): As surfaces. We explain the preparation of Si(1 0 0): As surfaces displaying an almost single-domain, (1x2) reconstructed surface with an RMS roughness = 1 angstrom and exhibiting broad, atomically flat terraces as well as regular double-layer steps. This surface is highly suitable for subsequent low-defect III-V integration.
机译:Si(1 0 0)上的低缺陷III-V集成需要原子上有序的异质界面。为此,我们利用金属有机化学气相沉积(MOCVD)过程中的反射各向异性光谱研究了As与Si(1 0 0)表面的相互作用以及二聚Si(1 0 0)的形成:As表面。通过控制表面过程,我们可以有意地“旋转”二聚体方向,并在(1x2)和(2x1)重构的Si(1 0 0)主要之间进行选择:作为用于低级和高级表面取向不良的表面。我们还验证了(2x1)表面重构在能量上更适合于邻近Si(1 0 0):作为表面。我们解释了Si(1 0 0)的制备:由于表面显示几乎是单畴的(1x2)重构表面,RMS粗糙度<= 1埃,并展现出宽广的原子平面平台以及规则的双层台阶。该表面非常适合随后的低缺陷III-V集成。

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