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Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

机译：用于二阶带通OTA-C滤波器的基于振荡的DFT

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摘要

This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor (OTA-C) filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter to oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25 m CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.
机译：本文介绍了一种使用基于振荡的测试拓扑的二阶带通运算跨导放大器和电容器（OTA-C）滤波器的可测试性技术设计。基于振荡的测试结构是一种无矢量输出测试策略，可以轻松扩展到内置自测。所提出的方法使用非常简单的技术将被测滤波器转换为正交振荡器，并测量输出频率。通过使用带有非线性模块的反馈环路，滤波器到振荡器的转换技术可以轻松地将带通OTA-C滤波器转换为振荡器。在最少数量的额外组件的情况下，提出的方案所需的面积开销可忽略不计。通过比较Tow-Thomas和KHN OTA-C滤波器的有故障和无故障仿真结果，验证了该方法的有效性。 0.25 m CMOS技术的仿真结果表明，所提出的基于OTA-C滤波器的基于振荡的测试策略适用于灾难性和参数性故障测试，并且还可以有效地检测具有高故障覆盖率的单个和多个故障。

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