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Acceptance sampling plan based on an exponentially weighted moving average statistic with the yield index for autocorrelation between polynomial profiles

机译:基于指数加权移动平均统计量与收益率指数的多项式分布之间的自相关的验收抽样计划

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摘要

Acceptance sampling plans based on process yield indices provide a proven resource for the lot-sentencing problem when the required fraction defective is very low. In this study, a new sampling plan based on the exponentially weighted moving average (EWMA) model with yield index for lot sentencing for autocorrelation between polynomial profiles is proposed. The advantage of the EWMA statistic is the accumulation of quality history from previous lots. In addition, the number of profiles required for lot sentencing is more economical than in the traditional single sampling plan. Considering the acceptable quality level (AQL) at the producer's risk and the lot tolerance percent defective (LTPD) at the consumer's risk, we proposed a new search algorithm to determine the optimal plan parameters. The plan parameters are tabulated for various combinations of the smoothing constant of the EWMA statistic, AQL, LTPD, and two risks. A comparison study and two numerical examples are provided to show the applicability of the proposed sampling plan.
机译:当所需的次品缺陷率非常低时,基于过程成品率指标的验收抽样计划可为批量判决问题提供可靠的资源。在这项研究中,提出了一种新的抽样计划,该计划基于具有产量指数的指数加权移动平均(EWMA)模型,用于批判量多项式分布之间的自相关。 EWMA统计数据的优点是积累了先前批次的质量历史。此外,量刑所需的档案数量比传统的单一抽样计划更经济。考虑到生产者承担风险时可接受的质量水平(AQL)和消费者承担风险时批次允差百分比(LTPD),我们提出了一种新的搜索算法来确定最佳计划参数。列出了EWMA统计信息的平滑常数,AQL,LTPD和两个风险的各种组合的计划参数。提供了比较研究和两个数值示例,以证明所提出的抽样计划的适用性。

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