AFM Imaging?Reliable or Not?: Validation and Verification of Images in Atomic Force Microscopy

Salapaka S.M.; Ramamoorthy A.; Salapaka M.V.

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AFM Imaging?Reliable or Not?: Validation and Verification of Images in Atomic Force Microscopy

机译：原子力显微镜成像“可靠与否”：原子力显微镜中图像的验证和验证

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Atomic force microscopy (AFM) was invented in 1986 [1]. By using a compliant flexure probe, such as a microcantilever beam with a sharp tip at one end, the interaction forces between atoms on the probe-tip and atoms on the material surface can be measured (see Figure 1). Since its invention, the simple strategy of using a beam with a sharp tip is now being employed to measure many diverse properties of matter at the nanometer scale including electrical, magnetic, chemical, and mechanical properties [2]. Many different operational modes have evolved that have demonstrated the versatility of the basic underlying principle [3]. AFM has led to many seminal insights in science such as obtained in the recent imaging of pentacene molecules with subatomic resolution [4].

机译：原子力显微镜（AFM）于1986年发明[1]。通过使用柔性挠性探针，例如一端具有尖锐尖端的微悬臂梁，可以测量探针尖端上的原子与材料表面上的原子之间的相互作用力（见图1）。自从其发明以来，使用具有尖锐尖端的光束的简单策略现在被用来在纳米尺度上测量物质的许多不同性质，包括电，磁，化学和机械性质[2]。已经发展出许多不同的操作模式，这些模式已经证明了基本基本原理的多功能性[3]。原子力显微镜已引起了许多开创性的科学见解，例如最近以亚原子分辨率对并五苯分子的成像[4]。

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《Control Systems, IEEE》 |2013年第6期|106-118|共13页
作者
Salapaka S.M.; Ramamoorthy A.; Salapaka M.V.;
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Mech. Eng. Dept., Univ. of Illinois, Urbana, IL, USA|c|;

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1. A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images. [J] . Lin AC, Goh MC Journal of Microscopy . 2002,第Pta2期

机译：一种新颖的样品架，允许在透射电子显微镜标本网格上进行原子力显微镜检查：AFM和TEM图像之间的重复直接相关。
2. A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images [J] . Lin AC., Goh MC. Journal of Microscopy . 2002,第Pta2期

机译：一种新颖的样品架，允许在透射电子显微镜标本网格上进行原子力显微镜检查：AFM和TEM图像之间的重复直接相关
3. Molecular Structures Of Gellan Gum Imaged With Atomic Force Microscopy (afm) In Relation To The Rheological Behavior In Aqueous Systems In The Presence Of Sodium Chloride [J] . Takahiro Funami, Sakie Noda, Makoto Nakauma, Food Hydrocolloids . 2009,第2期

机译：氯化钠存在下原子力显微镜（afm）成像的吉兰糖胶分子结构与水性体系流变行为的关系
4. Current Image Atomic Force Microscopy (CI-AFM) combined with Atomic Force Probing (AFP) for location and characterization of advanced technology node [C] . Tom X Tong, A N Erickson International Symposium for Testing and Failure Analysis(ISTFA 2004); 20041114-18; Worcester(Boston),MA(US) . 2004

机译：当前图像原子力显微镜（CI-AFM）与原子力探测（AFP）结合使用，可对先进技术节点进行定位和表征
5. Analytical and numerical modeling of contact using atomic force microscopy images. [D] . Bora, Kamil Can. 2012

机译：使用原子力显微镜图像对接触进行分析和数值建模。
6. Fabrication of Scanning Electrochemical Microscopy-Atomic Force Microscopy (SECM-AFM) Probes to Image Surface Topography and Reactivity at the Nanoscale [O] . Jeyavel Velmurugan, Amit Agrawal, Sangmin An, -1

机译：扫描电化学显微镜-原子力显微镜（SECM-AFM）探针的制备以纳米级成像表面形貌和反应性
7. Imaging silicon by atomic force microscopy with crystallographically oriented tips (so in der ZS angegeben) Vom Verfasser so:\ud Imaging Silicon with Crystallographically Oriented Tips by Atomic Force Microscopy / Proceedings of NC-AFM 2000 [O] . Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut, 2001

机译：通过原子力显微镜对硅进行成像，并具有晶体学取向的尖端（所以在der ZS angegeben中）Vom Verfasser如此：\ ud 通过原子力显微镜用晶体学取向的尖端对硅进行成像/ NC-AFM 2000的论文集
8. Atomic Force Microscopy of Liquid-Covered Surfaces: Atomic Resolution Images [R] . Marti, O., Drake, B., Hansma, P. K. 1987

机译：液体覆盖表面的原子力显微镜：原子分辨率图像

AFM Imaging?Reliable or Not?: Validation and Verification of Images in Atomic Force Microscopy

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